Key features include a micro-spot-focus x-ray tube and temperature-stabilized silicon PIN diode detector. The detector is said to have well-defined element peaks, eliminating the need for secondary filters. Minimal peak position drift ensures high stability over time and extends the interval between recalibrations. The standard L Series configuration also includes a four-position multiple collimator assembly and a micro-focus video camera synchronized with the x-ray optics. The Xralizer software combines intuitive visual controls with time-saving shortcuts, extensive data searchability and “one-click” reporting.
In addition to testing large parts, L Series instruments are said to be well-suited for fixtured components and for applications requiring multi-point measurement.
Bowman / 847-781-3523 / bowmanxrf.com
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